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A high-vacuum deposition system for in situ and real-time electrical characterization of organic thin-film transistors

Santiago David Quiroga, Arian Shehu, Cristiano Albonetti, Mauro Murgia, Pablo Stoliar, Francesco Borgatti, and Fabio Biscarini, USA (2011)

We present a home-built high vacuum system for performing organic semiconductor thin-film growth and its electrical characterization during deposition (real-time) or after deposition (in situ). Since the environment conditions remain unchanged during the deposition and electrical characterization process, a direct correlation between growth mode and electrical properties of thin-film can be obtained. Deposition rate and substrate temperature can be systematically fixed in the range 0.1-10ML/min and RT-150°C, respectively. The sample-holder configuration allows the simultaneous electrical monitoring of up to five organic thin-film transistors (OTFTs). The OTFTs parameters such as charge carriers mobility , threshold voltage VTH, and the on-off ratio Ion/Ioff are studied as a function of the semiconductor thickness, with a sub-monolayer accuracy. Design, operation and performance of the setup are detailed. As an example, the in situ and real-time electrical characterization of pentacene TFTs is reported.

Partners : CNR

Place of Publication : USA

Date of Publication : 2011/02/01

Link to the online version of the article.