Comparison of the heat exchange between a Wollaston wire probe and a resistively heated AFM probe
G.M. Lazzerini, O. Fenwick, F. Cacialli, (2012)
With a view to of thermal lithography applications we make use of finite element analysis to model the heat exchange between two different kinds of probe and a polymer substrate on quartz. A co mercial AFM tip and a Wollaston wire probe are compared by looking at the effect of their shape on the total heat exchange and the lithographic pattern resolution.
Partners : UCL
Additional Data : Extended abstract EOS conference Paris - October 2010